Development of an Apparatus to Measure Relative Reflectivity of Teflon Samples to 175 nm Light in Liquid Xenon
The LUX-ZEPLIN dark matter experiment is currently investigating the use of PTFE (Polytetraflouroethylene) best known as Teflon, for the internal walls of its liquid xenon detector, due to its high reflectivity for 175 nm light. In order to streamline research and development of the PTFE to be used in the detector, a new apparatus is currently being developed at Lawrence Berkeley National Laboratory to quickly measure the relative reflectivity of multiple samples of PTFE against 175 nm light in liquid xenon. My goals for the summer are to aid in designing and building some of the aspects of this apparatus, including a sample rack that can hold multiple samples of PTFE, the photodetection system, and the xenon gas system.
Message to Sponsor
- Major: Physics
- Sponsor: Rose Hills Experience
- Mentor: Dan McKinsey